|Statement||A. Benninghoven, F.G. Rüdenauer, H.W. Werner.|
|Series||Chemical analysis ;, v. 86|
|Contributions||Rüdenauer, F. G., Werner, H. W.|
|LC Classifications||QD96.S43 B46 1987|
|The Physical Object|
|Pagination||xxxv, 1227 p. :|
|Number of Pages||1227|
|LC Control Number||86011014|
May 16, · Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a surface-sensitive analytical method that uses a pulsed ion beam (Cs or microfocused Ga) to remove molecules from the very outermost surface of the sample. The particles are removed from atomic monolayers on the surface (secondary ions). Aug 18, · Paul van der Heide is a recognized leader in surface analysis with emphasis on the application of Secondary Ion Mass Spectrometry (SIMS). This interest started during his PhD (completed in at the University of Auckland) which involved the design and construction of a magnetic sector SIMS instrument. Introduction. In secondary ion mass spectrometry (SIMS), a focused beam of so-called primary ions bombards the surface of a sample and releases secondary ions from defined spots on the surface of the sample, which are subsequently analyzed in a mass tangoloji.com has its origins in inorganic materials science and semiconductor analysis and was the first technique available for mass Cited by: 1. Apr 15, · Cluster secondary ion mass spectrometry (SIMS) is a high spatial resolution imaging mass spectrometry technique, which can be used to characterize the three-dimensional chemical structure in complex organic and molecular systems. It works by using a cluster ion source to sputter desorb material from a solid sample surface.
Cluster secondary ion mass spectrometry (SIMS) is a high spatial resolution imaging mass spectrometry technique, which can be used to characterize the three-dimensional chemical structure in complex organic and molecular systems. It works by using a cluster ion source to sputter desorb material from a solid sample tangoloji.com by: Secondary Ion Mass Spectrometry (SIMS) has become an indispensible, fully commercialized micro-analytical technique applied in a diverse range of fields spanning the Materials Sciences, Earth sciences and Bio-Sciences with new application field continually being tangoloji.com by: The aim of this text is to provide the Secondary Ion Mass Spectrometry (SIMS) analyst and the SIMS customer with information that will result in the acquisition of improved data. The technique of Secondary Ion Mass Spectrometry (SIMS) is the most sensitive of all the commonly-employed surface analytical techniques - capable of detecting impurity elements present in a surface layer at.
This book is the proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry (SIMS VI) held in Paris in The sections cover basics, instrumentation, quantification, ion imaging, depth profiling, organics, combined techniques, surfaces, and several applications. References date from the s to the present. Nanoscale secondary ion mass spectrometry (nanoSIMS) is a nanoscopic scale resolution chemical imaging mass spectrometer based on secondary ion mass spectrometry. It works based on a coaxial optical design of the ion gun and the secondary ion extraction, and on an original magnetic sector mass spectrometer with multicollection. May 05, · Mass Spectroscopy Mass spectrometry (MS) is an analytical technique that measures mass to Charge ratio of charged particles. Secondary ion mass spectrometry Secondary ion mass spectrometry (SIMS) is based on the observation of charged particles (Secondary Ions) are ejected from a sample surface when bombarded by a primary beam of heavy particles. A Bennmghoven, K T F Jansen, J Tompner and H W Werner (Eds 1, Secondary Zon Mass Spectrometry SIMS VlZZ, Wiley, Chichester, (ISBN O) xxv + pp Price 00 These Proceeduzgs of the Eighth Zntematumal Conference on Secondary Zon Mass Spectrometry.